采用场发射双束扫描电镜(FIB)对腐蚀试样沿膜深度方法取样;采用扫描电镜分析氧化膜断面内部结构和元素组成。
The corrosion samples were sampled along the membrane depth by field emission dual beam scanning electron microscopy (FIB). Scanning electron microscopy was used to analyze the internal structure and elemental composition of the oxide film