用场发射电子探针(EPMA)对微观结构进行了表征,试样分别沿复合板轧向取样。采用机械研磨、抛光、4% nital溶液腐蚀的制备纵向横截面试样,使用JEOL JXA-8530F场发射电子探针显微分析仪进行显微组织观察。
The microstructure was characterized by field emission electron probe (EPMA), and the specimens were taken along the rolling direction of the cladding plate. The longitudinal cross-sectional specimens were prepared by mechanical grinding, polishing, and etching with 4% nital solution, and the microstructure was observed using a JEOL JXA-8530F field emission electron probe microanalyzer.