从厦门虹鹭钨业有限公司提供的烧结纯钨坯料、17%、60%和80%轧制板坯中，分别切取6*10*3mm尺寸的金相试样，进行精密机械抛光。然后将纯钨金相样品的表面进行Ar离子刻蚀。将Ar离子精密刻蚀的试样，进行电子背散射衍射（EBSD）测试，采集到晶粒尺寸分布和晶界特征图片和数据。EBSD测试步长取1.0μm，小于平均晶粒尺寸的1/10。借助Channel 5后处理软件进行EBSD数据分析，使用Origin软件绘制出晶粒尺寸和晶界特征的分布曲线。

From the sintered pure tungsten blanks, 17%, 60%, and 80% rolled slabs provided by Xiamen Honglu Tungsten Industry Co., Ltd., metallographic samples of 6*10*3mm size were respectively cut and subjected to precision mechanical polishing. Then the surface of the pure tungsten metallographic sample is etched by Ar ion. The Ar ion precision etched sample was subjected to electron backscatter diffraction (EBSD) test, and the grain size distribution and grain boundary characteristic pictures and data were collected. The EBSD test step size is 1.0μm, which is less than 1/10 of the average grain size. EBSD data analysis was carried out with Channel 5 post-processing software, and the distribution curve of grain size and grain boundary characteristics was drawn using Origin software.