从采购的粒度为200nm、1μm、2μm和10μm等高纯钨粉末中，分别取样2g粉末，铺设在导电胶上并振实，然后置于扫描电镜下进行颗粒形貌的观察，观察倍数在1000、5000和10000倍，分别拍摄SEM颗粒形貌照片。

From the purchased high-purity tungsten powder with particle size of 200nm, 1μm, 2μm and 10μm, 2g powder was sampled, laid on conductive adhesive and vibrated, and then placed under scanning electron microscope to observe the particle morphology. The observation multiple was 1000, 5000 and 10000 times, and SEM particle morphology photos were taken respectively. Two grams of powder were taken out, and the powder was stirred and mixed with distilled water to prepare the suspension. The test data of powder particle size were obtained by laser particle size tester. Use Origin software to draw the powder size distribution curve.