选取超高纯W粉、高纯Ti/TiH2粉末,检测原材料的微观组织。通过带有背散射电子成像的场发射电子扫描电镜(SEM)观察粉末的微观组织。其中SEM加速电压15-20KV,放大倍数500-2000×。
Ultrahigh purity W powder and high purity Ti/TiH2 powder were selected to detect the microstructure of raw materials. The microstructure of powder was observed by field emission electron scanning electron microscopy (SEM) with backscattered electron imaging. SEM acceleration voltage 15-20kV, amplification factor 500-2000×