在光束线分析之前,样品被压制成直径为 1 厘米的薄片,并用 Kapton 胶带薄膜密封。在室温下使用布鲁克 5040 型 4 通道硅漂移探测器(SDD)记录。 光谱由 Athena 和 Artemis 软件处理和分析。
Prior to beamline analysis, the sample was pressed into a 1 cm diameter sheet and sealed with a Kapton tape film. Recorded at room temperature using a Bruker Model 5040 4-channel Silicon drift detector (SDD). The spectra were processed and analyzed by Athena and Artemis software.