用原子力显微镜(Nanoscope V, Bruker)对样品的表面形貌进行了表征。测量采用氮化硅探针用于接触式或轻敲模式进行测量。扫描区域为800 nm × 800 nm。
The surface morphology of the samples was characterized by Nanoscope V (Bruker). Measurements are made using silicon nitride probes in contact or tap mode. The scanning region is 800 nm × 800 nm.