以含Ni还原钨粉为原料,使用配备有能谱仪(EDS)的透射电子显微镜对分析区域进行线扫,加速电压为200 kV。
Using Ni-containing reduced tungsten powder as raw material, a transmission electron microscope equipped with an energy spectrometer (EDS) was used to scan the analysis area with an acceleration voltage of 200 kV.