The TEM sample of the alloy after oxidation at 750 °C for 100 h was carefully positioned at the scale/substrate interface via FIB (Figa). Since the scale of the sample oxidized at such a condition has a proper thickness and remains integrated, it is selected to be cut by FIB. A TEM bright field (BF) image of the sample is shown in Figb, consisting of the scale and the Ti matrix (i.e., the substrate). Liner elemental analysis has been done along the line with an arrowhead in Figb, the result of which is shown in Figc.
The TEM sample of the alloy after oxidation at 750 °C for 100 h was carefully positioned at the scale/substrate interface via FIB (Figa). Since the scale of the sample oxidized at such a condition has a proper thickness and remains integrated, it is selected to be cut by FIB. A TEM bright field (BF) image of the sample is shown in Figb, consisting of the scale and the Ti matrix (i.e., the substrate). Liner elemental analysis has been done along the line with an arrowhead in Figb, the result of which is shown in Figc.