在STEM模式下,对热处理时间为0h、10h、24h及120h的扩散偶界面TEM样品进行EDS面扫及线扫分析,观察氧元素随热处理时间的延长的变化规律。
In STEM mode, EDS surface scanning and line scanning analysis were performed on TEM samples with diffused dual interface for heat treatment time of 0h, 10h, 24h and 120h, and the changes of oxygen elements with the extension of heat treatment time were observed.