该数据是由薄壁包壳进行EBSD测试采集的顶部和底部的横截面数据。两个面均没有明显的晶粒取向优化的现象，晶粒的取向在<001>、<101>和<111>三个方向上均有分布。图中c与d分别为包壳顶部与底部横截面的极图，两个面的极图均没有表现出强烈的织构。

The data are top and bottom cross-sectional data collected by thin-walled cladding for EBSD testing. There is no obvious phenomenon of grain orientation optimization in both planes, and the grain orientation is distributed in <001>, <101> and <111> directions.

In the figure, c and d are the polar diagrams of the top and bottom cross sections of the cladding respectively, and the polar diagrams of the two faces do not show strong texture.