该数据是由薄壁包壳进行EBSD测试采集的顶部和底部的纵截面数据。底部的晶粒更加集中于<001>和<101>方向，而在<111>方向上的晶粒很少，顶部的晶粒取向则在<001>、<101>和<111>三个方向上均有分布，没有明显的取向优化现象。图c与d分别为包壳顶部与底部纵截面的极图，可以明显看到两者均没有强烈的织构。

The data are the top and bottom longitudinal section data collected by EBSD test of thin-walled cladding. The grain orientation at the bottom is more concentrated in <001> and <101> directions, while the grain orientation at the <111> direction is very few. The grain orientation at the top is distributed in <001>, <101> and <111> directions, without obvious orientation optimization phenomenon. Figure c and d are the polar diagrams of the longitudinal sections at the top and bottom of the cladding, respectively. It is obvious that there is no strong texture in either of them.