用场发射电子探针（EPMA）对微观结构进行了表征，试样分别沿复合板轧向取样。采用机械研磨、抛光、4% nital溶液腐蚀的制备纵向横截面试样，使用JEOL JXA-8530F场发射电子探针显微分析仪进行界面元素分析。

Field emission electron probe (EPMA) was used to characterize the microstructure, and the samples were sampled along the rolling direction of the composite plate. The longitudinal cross-section specimens were prepared by mechanical grinding, polishing, and corrosion in 4% nital solution, and interface element analysis was carried out using JEOL JXA-8530F field emission electron probe microanalyzer.