用于 EBSD 测量的所有样品均使用 BUEHLER 振动抛光机制备。 EBSD 测量在配备 Aztec 采集软件的 ZEISS MERLIN Compact 场发射扫描电子显微镜 (FE-SEM) 中进行,步长为 0.125 μm。 所有 EBSD 数据均由 HKL Channel 软件处理。V含量对熔敷金属基体微观组织影响不大,主要影响其相析出行为。
All specimens for EBSD measurements were prepared using BUEHLER Vibratory Polisher. EBSD measurements were performed in a ZEISS MERLIN Compact field-emission scanning electron microscope (FE-SEM) equipped with Aztec acquisition software using a step size of 0.125 μm. All EBSD data was processed by HKL Channel software. V content had little effect on the microstructure of the deposited metal matrix, and mainly affected its phase precipitation behavior.